An electronic device fetches first information from memory devices concerning errors associated with radiation effects in the memory devices and fetches second information about system performance associated with the electronic device. The electronic device monitors current parameters of the memory devices and calculates parameter values for configuration of the memory devices based on the fetched first information, the fetched second information, and the monitored current parameters, the calculating performed to adjust the parameter values to improve a metric of the system performance against the errors associated with the radiation. The electronic device implements the calculated parameter values for the configuration of the memory devices.