Invention Publication
- Patent Title: Devices, Systems, and Methods for Analyzing Measurement Objects
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Application No.: US18071690Application Date: 2022-11-30
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Publication No.: US20240175807A1Publication Date: 2024-05-30
- Inventor: Kotaro ISHIZAKI , Agata Dorota ISHIZAKI-SROKA
- Applicant: Aikemy Gmbh
- Applicant Address: CH Zurich
- Assignee: Aikemy Gmbh
- Current Assignee: Aikemy Gmbh
- Current Assignee Address: CH Zurich
- Main IPC: G01N21/27
- IPC: G01N21/27

Abstract:
A device for analyzing a sample includes a measurement area at which the sample is to be located, an illumination arrangement, and first and second spectral sensors. The illumination arrangement illuminates the measurement area such that the illumination is incident on the sample. Each of the first and second spectral sensors is oriented toward the measurement area to collect illumination arriving from the measurement area. The first spectral sensor performs a spectral measurement of the sample in response to the incident illumination so as to produce spectral measurement data. The second spectral sensor measures background noise so as to produce background measurement data that provides at least a partial correction for noise in the spectral measurement data. In certain embodiments, operation of the first and second spectral sensors is switched such that the second spectral sensor performs a spectral measurement and the first spectral sensor measures background noise.
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