Invention Publication
- Patent Title: OPTIMIZING DATA RELIABILITY USING ERASE RETENTION
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Application No.: US18514926Application Date: 2023-11-20
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Publication No.: US20240176496A1Publication Date: 2024-05-30
- Inventor: Zhongguang XU , Ronit Roneel PRAKASH , Murong LANG , Ching-Huang LU , Zhenming ZHOU
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F3/06
- IPC: G06F3/06
Abstract:
Methods, systems, and apparatuses include moving a portion of memory to a garbage pool in response to determining that the portion of memory is invalid. The portion of memory is erased in response to determining that the portion of memory is invalid. A request to move an additional portion of memory to a free pool from the garbage pool is received. A free pool includes a queue including erased portions of memory, which serve as next portions of memory to fulfill subsequent cursor requests. The erased portion of memory is moved from the garbage pool to the free pool.
Information query
