A compensation method for a characteristic difference of a photoelectric element is disclosed. The method includes (S1) providing a test substrate with a connector, a photoelectric element and a plurality of gain units, wherein the plurality of gain units are connected in parallel, and each gain unit includes a gain resistor and a disconnection port; (S2) connecting the connector to a test fixture which includes a test resistor and a test control unit, wherein when the test fixture is connected with the connector, the test resistor is electrically connected between the second pin and the third pin; (S3) providing input power to the connector so as to generate a test voltage on the photoelectric element; (S4) selecting the corresponding gain unit according to the test voltage and a classification data table; (S5) driving a production line to connect the first contact and the second contact of the selected gain unit.