Invention Publication
- Patent Title: METHOD FOR MUTUALLY ATTESTING SECURITY LEVELS OF ELECTRONIC DEVICES IN MULTI DEVICE ENVIRONMENT
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Application No.: US18532453Application Date: 2023-12-07
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Publication No.: US20240179013A1Publication Date: 2024-05-30
- Inventor: Bumhan KIM , Hyewon PARK , Dasom LEE
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR 20220163267 2022.11.29 KR 20230002705 2023.01.09
- Main IPC: H04L9/32
- IPC: H04L9/32

Abstract:
An electronic device is provided. The electronic device includes a communication module for supporting near-field wireless communication, memory, and at least one processor operatively connected to the communication module and the memory. The memory stores one or more programs including instructions that, when executed by the at least one processor, may cause the electronic device to establish near-field wireless communication connection with an external device through the communication module, generate a first private key by using a determined random function, generate a first public key based on the first private key, generate a first certificate including a security level of the electronic device with respect to the first public key, and transmit the generated first certificate to the external device through the communication module.
Information query