Invention Publication
- Patent Title: FINE DUST MASS MEASUREMENT DEVICE AND OPERATING METHOD THEREOF
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Application No.: US18204559Application Date: 2023-06-01
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Publication No.: US20240192172A1Publication Date: 2024-06-13
- Inventor: Ilhwan KIM , Changhyeon KIM , Kangyoon LEE
- Applicant: SAMSUNG ELECTRONICS CO., LTD. , RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee Address: KR Suwon-si; KR Suwon-si
- Priority: KR 20220171867 2022.12.09
- Main IPC: G01N29/02
- IPC: G01N29/02 ; G01N29/44

Abstract:
A dust mass measurement device includes a sensing channel configured to generate a sensing clock signal, a reference channel configured to generate a reference clock signal, a counter configured to generate a first output signal based on the sensing clock signal, and generate a second output signal based on the reference clock signal, and a controller configured to calculate a frequency difference between the sensing clock signal and the reference clock signal based on a difference value between the first output signal and the second output signal, which are received from the counter, and measure a mass of dust based on the calculated frequency difference.
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