Invention Publication
- Patent Title: LOW STRESS TUNGSTEN LAYER DEPOSITION
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Application No.: US18107326Application Date: 2023-02-08
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Publication No.: US20240266215A1Publication Date: 2024-08-08
- Inventor: Xi CEN , Yang LI , Kai WU , Mehran BEHDJAT , Jallepally RAVI
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/3205

Abstract:
A method of forming a structure on a substrate, includes forming a nucleation layer within an opening of the substrate within a processing chamber. The method further includes forming a passivation layer on at least a portion of the nucleation layer by introducing radical treatment into the processing chamber. The method further includes forming a tungsten fill layer within the opening over the passivation layer and the nucleation layer, wherein the tungsten fill layer is formed by a plurality of treatment cycles. Each treatment cycle includes pulsing a first gas at the substrate for a pulse time duration while concurrently flowing a second gas over the substrate, and purging the first gas and the second gas by flowing a purge gas over the substrate for a purge time duration.
Information query
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