- 专利标题: Etching Solution For Selectively Removing Silicon-Germanium Alloy From A Silicon-Germanium/ Silicon Stack During Manufacture Of A Semiconductor Device
-
申请号: US18561030申请日: 2022-04-26
-
公开(公告)号: US20240271040A1公开(公告)日: 2024-08-15
- 发明人: WEN DAR LIU , YI-CHIA LEE , AIPING WU
- 申请人: Versum Materials US, LLC
- 申请人地址: US AZ Tempe
- 专利权人: Versum Materials US, LLC
- 当前专利权人: Versum Materials US, LLC
- 当前专利权人地址: US AZ Tempe
- 国际申请: PCT/US22/71907 2022.04.26
- 进入国家日期: 2023-11-15
- 主分类号: C09K13/08
- IPC分类号: C09K13/08 ; H01L21/306
摘要:
The disclosed and claimed subject matter pertains to an etching solution including (i) water, (ii) at least one oxidizer, (iii) at least one fluoride ion source, (iv) at least one polyfunctional acid; (v) at least one corrosion inhibiting surfactant, (vi) at least one silane silicon oxide etch inhibitor and (vii) optionally at least one water-miscible organic solvent. The solutions are useful for the selective removal of silicon-germanium over poly silicon from a microelectronic device having such material(s) thereon during its manufacture.
信息查询