Invention Publication
- Patent Title: APPARATUSES AND METHODS FOR READ COMMANDS WITH DIFFERENT LEVELS OF ECC CAPABILITY
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Application No.: US18588402Application Date: 2024-02-27
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Publication No.: US20240296095A1Publication Date: 2024-09-05
- Inventor: Sujeet Ayyapureddi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F11/10
- IPC: G06F11/10

Abstract:
Apparatuses, systems, and methods for read commands with different levels of error correction code (ECC) capability. A memory receives a first type of read command and reads data with a first level of ECC and receives a second type of read command and reads the data with a second level of ECC. For example, single error correction (SEC) may be used as part of the first type of read command and more errors may be detected/corrected as part of the second type of read command. A controller may read data using the first type of read command and if a signal is received indicating that an error was detected may read the data again using the second type of read command.
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