发明公开
- 专利标题: EXAMINATION APPARATUS
-
申请号: US18593789申请日: 2024-03-01
-
公开(公告)号: US20240298893A1公开(公告)日: 2024-09-12
- 发明人: HIROTO KANO
- 申请人: CANON KABUSHIKI KAISHA
- 申请人地址: JP Tokyo
- 专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人地址: JP Tokyo
- 优先权: JP 23036747 2023.03.09
- 主分类号: A61B3/00
- IPC分类号: A61B3/00 ; A61B3/103 ; A61B3/15 ; H04N25/62
摘要:
An examination apparatus detecting first reflected light from a first eye of a subject and second reflected light from a second eye of the subject includes an imaging device, and a processing unit. The imaging device includes pixels each including a first photoelectric conversion unit and a second photoelectric conversion unit. The processing unit includes a unit configured to acquire a first signal based on the first reflected light entering the first photoelectric conversion units and a second signal based on the second reflected light entering the second photoelectric conversion units, a unit configured to acquire crosstalk amounts of the first and second signals based on information about positions of the first and second eyes, and a unit configured to generate correction signals based on the first and second signals and amounts of the crosstalk.
信息查询