Invention Publication
- Patent Title: RUNTIME STORAGE CAPACITY REDUCTION AVOIDANCE IN SEQUENTIALLY-WRITTEN MEMORY DEVICES
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Application No.: US18675934Application Date: 2024-05-28
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Publication No.: US20240311004A1Publication Date: 2024-09-19
- Inventor: Vinay Vijendra Kumar Lakshmi , Vijaya Janarthanam
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A system includes a memory device having a plurality of blocks. A first subset of the plurality of blocks is configured as single-level cell (SLC) memory and a second subset of the plurality of blocks is configured as multi-level cell (MLC) memory. A processing device, operatively coupled to the memory device, determines that a first block of a set of blocks of the first subset is a bad block, wherein the first block is located in a first plane of the memory device. The processing device converts a second block of the set of blocks to the MLC memory of the second subset, wherein the second block is located in a second plane of the memory device, and wherein the second plane is neighboring the first plane.
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