Invention Publication
- Patent Title: SYSTEMS AND METHODS FOR DETERMINING CORRECTION PARAMETERS FOR IMAGING DEVICES
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Application No.: US18674977Application Date: 2024-05-27
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Publication No.: US20240312062A1Publication Date: 2024-09-19
- Inventor: Songsong TANG , Yong ZHAO , Xin FAN
- Applicant: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
- Current Assignee: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
- Current Assignee Address: CN Shanghai
- Priority: CN 1910390320.5 2019.05.10
- Main IPC: G06T7/80
- IPC: G06T7/80 ; A61B6/03 ; A61B6/58

Abstract:
Systems and methods for determining at least one correction parameter for a Positron Emission Tomography (PET) scanner including a plurality of detector units is provided. For each line of response (LOR) of a plurality of lines of response (LORs) associated with the plurality of detector units, the methods may include determining, based on scan data of one or more scans of a phantom at a plurality of positions, a first sum of coincidence events on the LOR, wherein the phantom is moved to the plurality of positions along an axis of a field of view of the PET scanner during the one or more scans, and a length of the phantom is less than a length of the field of view of the PET scanner along the axis; determining, based on the first sum of coincidence events, at least one correction parameter associated with the LOR.
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