- 专利标题: HIGH-SPEED DEBUG PORT TRACE CIRCUIT
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申请号: US18193488申请日: 2023-03-30
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公开(公告)号: US20240330145A1公开(公告)日: 2024-10-03
- 发明人: Elessar Taggart , Ishita Ghosh , Rishi Bharadwaj Subramanian
- 申请人: Xilinx, Inc.
- 申请人地址: US CA San Jose
- 专利权人: Xilinx, Inc.
- 当前专利权人: Xilinx, Inc.
- 当前专利权人地址: US CA San Jose
- 主分类号: G06F11/34
- IPC分类号: G06F11/34
摘要:
An integrated circuit includes a high-speed debug port trace circuit. The high-speed debug trace circuit includes a plurality of input receiver circuits each configured to receive a stream of trace data. The plurality of input receiver circuits receive streams of trace data from a plurality of compute circuits of different compute circuit types. The plurality of compute circuits are within the integrated circuit. The high-speed debug trace circuit includes a stream selector circuit configured to perform multiple stages of arbitration among the plurality of streams of trace data to generate output trace data. The stream selector circuit inserts compute circuit type identifiers within the output trace data. Each compute circuit type identifier specifies a compute circuit type that originated each portion of trace data of the output trace data. The high-speed debug trace circuit includes an output transmitter circuit configured to output the output trace data.
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