Invention Publication
- Patent Title: LEARNING DEVICE, LEARNING METHOD, AND NONDESTRUCTIVE INSPECTION SYSTEM
-
Application No.: US18290660Application Date: 2022-03-17
-
Publication No.: US20240331129A1Publication Date: 2024-10-03
- Inventor: Naganori SHIRAKATA
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Priority: JP 21120434 2021.07.21
- International Application: PCT/JP2022/012178 2022.03.17
- Date entered country: 2024-01-19
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/90

Abstract:
A learning device that comprises a preprocessing circuit and a learning circuit. The preprocessing circuit performs processing that converts the relative phase differences and relative intensity differences between a plurality of transmission/reception waves that are based on the radiation of electromagnetic waves at a measured object into a color image. The learning circuit uses first color images that have been processed by the preprocessing circuit and training data that associates second color images and types of internal states for measured objects to learn an identification model for identifying the types of internal states.
Information query