Invention Publication
- Patent Title: MONITORING SYSTEM, MONITORING APPARATUS, AND MONITORING METHOD
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Application No.: US18291374Application Date: 2021-07-29
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Publication No.: US20240331385A1Publication Date: 2024-10-03
- Inventor: Hayato Itsumi , Koichi Nihei , Yusuke Shinohara , Takao Onomura , Yutaka Takei
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- International Application: PCT/JP2021/028169 2021.07.29
- Date entered country: 2024-01-23
- Main IPC: G06V20/52
- IPC: G06V20/52 ; G06V20/40 ; G06V20/56

Abstract:
A state analysis unit analyzes the state of each of a plurality of monitoring targets based on sensor data received from the plurality of monitoring targets, and determines whether or not a predetermined event has occurred in each of the monitoring targets. A surveillant allocation unit determines one of the plurality of surveillants who is responsible for work of monitoring the monitoring target where it has been determined that the predetermined event has occurred based on the predetermined event that has occurred and a load index indicating the monitoring work by the surveillant.
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