Invention Publication
- Patent Title: CRITERION AND CONFORMANCE TEST FOR ELIGIBILITY OF SENSING BEAMS FOR CHANNEL ACCESS
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Application No.: US18576340Application Date: 2021-08-06
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Publication No.: US20240340064A1Publication Date: 2024-10-10
- Inventor: Vinay CHANDE , Jing SUN , Arumugam CHENDAMARAI KANNAN , Giovanni CHISCI , Siyi CHEN , Mohammed Ali Mohammed HIRZALLAH , Aleksandar DAMNJANOVIC , Xiaoxia ZHANG , Tao LUO
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- International Application: PCT/CN2021/111100 2021.08.06
- Date entered country: 2024-01-03
- Main IPC: H04B7/06
- IPC: H04B7/06 ; H04W48/16 ; H04W74/0808

Abstract:
Certain aspects of the present disclosure provide techniques for determining if a first sensing beam is eligible for use in channel sensing by a device under test (DUT) for at least a first transmission beam, generally including evaluating the first sensing beam against eligibility criterion based on measurement of sensing gain for the first sensing beam in multiple directions and declaring the first sensing beam eligible for channel sensing for the first transmission beam when the first sensing beam satisfies the eligibility criterion.
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