发明公开
- 专利标题: WAVEFORM-ANALYZING METHOD, WAVEFORM-ANALYZING DEVICE, AND ANALYZING SYSTEM
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申请号: US18631581申请日: 2024-04-10
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公开(公告)号: US20240345046A1公开(公告)日: 2024-10-17
- 发明人: Hitomi YOSHIYAMA-KITAJIMA , Shinji KANAZAWA
- 申请人: SHIMADZU CORPORATION
- 申请人地址: JP Kyoto
- 专利权人: SHIMADZU CORPORATION
- 当前专利权人: SHIMADZU CORPORATION
- 当前专利权人地址: JP Kyoto
- 优先权: JP 23065939 2023.04.13
- 主分类号: G01N30/86
- IPC分类号: G01N30/86 ; G01N30/72
摘要:
A model for locating a peak portion in a chromatogram or similar waveform is trained by machine learning using multiple sets of partial waveforms prepared by dividing each reference waveform having a known peak position. An analysis-target waveform is divided into partial waveforms, and whether or not a partial waveform is a peak portion is determined for each partial waveform by the trained model, to estimate different kinds of regions in the analysis-target waveform, including an overlap-peak region. For an overlap peak within a region estimated to be an overlap-peak region, whether or not that peak is a multimodal peak originating from one component is determined, using at least the height of a peak in the overlap peak, the depth of the trough between two neighboring peaks, or the horizontal width of the portion between the bottom of the trough and the top of one of the neighboring peaks.
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