- 专利标题: TEST DEVICE FOR HIGH-FREQUENCY APPLICATIONS
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申请号: US18577425申请日: 2022-06-23
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公开(公告)号: US20240345148A1公开(公告)日: 2024-10-17
- 发明人: Wilhelm Schroff , Sergiy Royak
- 申请人: INGUN PRÜFMITTELBAU GMBH
- 申请人地址: DE Konstanz
- 专利权人: INGUN PRÜFMITTELBAU GMBH
- 当前专利权人: INGUN PRÜFMITTELBAU GMBH
- 当前专利权人地址: DE Konstanz
- 优先权: DE 2021117664.6 2021.07.08
- 国际申请: PCT/EP2022/067178 2022.06.23
- 进入国家日期: 2024-01-08
- 主分类号: G01R29/08
- IPC分类号: G01R29/08 ; G01R29/10
摘要:
A test probe (10) for contactlessly measuring the electromagnetic properties of a radio unit (20), in particular an antenna unit, having a hollow conductor (1) for transmitting electromagnetic waves, a filling element (2) which is disposed in the hollow conductor and made of a dielectric material, a lens element (3) which is disposed on the end face of the hollow conductor (1) and made of a dielectric material for coupling electromagnetic waves into the hollow conductor (1), and a contact portion (4) which is disposed on the hollow conductor end opposite the lens element (3) and which serves to decouple a measurement signal.
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