Invention Publication
- Patent Title: MANAGING DATA INTEGRITY USING A CHANGE IN A NUMBER OF DATA ERRORS AND AN AMOUNT OF TIME IN WHICH THE CHANGE OCCURRED
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Application No.: US18755592Application Date: 2024-06-26
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Publication No.: US20240345919A1Publication Date: 2024-10-17
- Inventor: Ryan G. Fisher
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/07

Abstract:
Exemplary methods, apparatuses, and systems include performing an initial data integrity scan of a subset of memory at an initial time to determine an initial error rate for the subset of memory. The initial error rate and the initial time are stored. A subsequent integrity scan of the subset of memory is performed at a second time to determine a subsequent error rate for the subset of memory. A difference between the initial error rate and the subsequent error rate is determined. A difference between the initial time and the subsequent time is determined. A remedial action is selected using the difference between the initial error rate and the subsequent error rate and the difference between the initial time and the subsequent time and the remedial action is performed.
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