Invention Application
- Patent Title: COMBINED GARBAGE COLLECTION AND DATA INTEGRITY CHECKING FOR A DISTRIBUTED KEY-VALUE STORE
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Application No.: US18786848Application Date: 2024-07-29
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Publication No.: US20240385959A1Publication Date: 2024-11-21
- Inventor: Wei Sun , Mark David Olson , Anil Paul Thoppil
- Applicant: NetApp, Inc.
- Applicant Address: US CA San Jose
- Assignee: NetApp, Inc.
- Current Assignee: NetApp, Inc.
- Current Assignee Address: US CA San Jose
- Main IPC: G06F12/02
- IPC: G06F12/02 ; G06F16/22

Abstract:
Systems and methods are described for a streamlined garbage collection process during which data integrity checking is also performed for a distributed key-value (KV) store utilized by a distributed storage system. According to one embodiment, by making use of full or truncated block IDs (rather than an intermediate probabilistic data structure, such as a Bloom filter) for garbage collection, data integrity checking can be performed concurrently almost for free. During garbage collection, a block ID compare list may be compared to block IDs within the distributed KV store. If a particular block ID is present in the distributed KV store but is missing from the block ID compare list, the corresponding data block represents garbage to be collected. If the particular block ID is present in the block ID compare list but missing from the distributed KV store, a data integrity error has been identified.
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