Invention Grant
- Patent Title: Photocell testing circuit
- Patent Title (中): 光电池测试电路
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Application No.: US31790352Application Date: 1952-10-31
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Publication No.: US2687253APublication Date: 1954-08-24
- Inventor: MCMILLAN WILMUR M
- Applicant: IBM
- Assignee: Ibm
- Current Assignee: Ibm
- Priority: US31790352 1952-10-31
- Main IPC: G06K7/10
- IPC: G06K7/10
Information query
