Specimen holder for an electron microscope with means to support a specimen across a thermocouple junction

Invention Grant

US3171957A Specimen holder for an electron microscope with means to support a specimen across a thermocouple junction 失效

Title translation: 用于电子显微镜的样品架，其具有用于在热电偶结上支撑样品的装置

Patent Title: Specimen holder for an electron microscope with means to support a specimen across a thermocouple junction
Patent Title (中): 用于电子显微镜的样品架，其具有用于在热电偶结上支撑样品的装置
Application No.: US18394662

Application Date: 1962-03-30
Publication No.: US3171957A

Publication Date: 1965-03-02
Inventor: COLEMAN JOHN W , CARDILE ANGELO J
Applicant: RCA CORP
Assignee: Mindset Holding SA
Current Assignee: Mindset Holding SA
Priority: US18394662 1962-03-30
Main IPC: H01J37/20
IPC: H01J37/20

Public/Granted literature

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01J	放电管或放电灯（火花隙入H01T；消耗电极的弧光灯入H05B；粒子加速器入H05H）
H01J37/00	有把物质或材料引入使受到放电作用的结构的电子管，例如为了对其检验或加工的（H01J33/00、H01J40/00、H01J41/00、H01J47/00、H01J49/00优先）
H01J37/02	.零部件
H01J37/20	..物体或材料的支承或定位装置；与支架相联的光阑或透镜的调整装置