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US3976934A Method and apparatus for the continuous, contactless testing of a long conductor which consists at least partially of superconductive material 失效
用于对至少部分由超导材料构成的长导体的连续，非接触测试的方法和装置

  • 专利标题： Method and apparatus for the continuous, contactless testing of a long conductor which consists at least partially of superconductive material
  • 专利标题（中）： 用于对至少部分由超导材料构成的长导体的连续，非接触测试的方法和装置
  • 申请号： US590678
    申请日： 1975-06-26
  • 公开(公告)号： US3976934A
    公开(公告)日： 1976-08-24
  • 发明人: Hans Voigt , Gunther Rupp
  • 申请人： Hans Voigt , Gunther Rupp
  • 申请人地址： DT Munich
  • 专利权人： Siemens Aktiengesellschaft
  • 当前专利权人： Siemens Aktiengesellschaft
  • 当前专利权人地址： DT Munich
  • 优先权： DT2431505 19740701
  • 主分类号： H01L39/00
  • IPC分类号： H01L39/00 ;  G01N27/90 ;  G01R31/02 ;  G01R33/12
Method and apparatus for the continuous, contactless testing of a long conductor which consists at least partially of superconductive material
摘要：
A method and apparatus for the continuous, contactless testing of a long conductor which consists at least partially of superconductive material in which the conductor is moved, with the superconductive material in the superconducting state, through an external magnetic field which induces shielding currents in the superconductive material, while the magnetic field produced by these shielding currents is measured.
摘要（中）：

一种用于对长导体进行连续，非接触测试的方法和装置，所述长导体至少部分地由超导材料构成，其中导体被移动，超导材料处于超导状态，通过外部磁场，其引起超导中的屏蔽电流 同时测量由这些屏蔽电流产生的磁场。

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