发明授权
US3992664A Method for measuring parameters of quartz crystal unit and a
non-reactive constant resistance element for carrying out the same
失效
用于测量石英晶体单元的参数的方法和用于执行其的无功恒定电阻元件
- 专利标题: Method for measuring parameters of quartz crystal unit and a non-reactive constant resistance element for carrying out the same
- 专利标题(中): 用于测量石英晶体单元的参数的方法和用于执行其的无功恒定电阻元件
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申请号: US638914申请日: 1975-12-08
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公开(公告)号: US3992664A公开(公告)日: 1976-11-16
- 发明人: Issac Koga , Isao Okamoto , Shigeo Kobayashi
- 申请人: Issac Koga , Isao Okamoto , Shigeo Kobayashi
- 申请人地址: JA Tokyo
- 专利权人: Kokusai Denshin Denwa Kabushiki Kaisha
- 当前专利权人: Kokusai Denshin Denwa Kabushiki Kaisha
- 当前专利权人地址: JA Tokyo
- 优先权: JA50-455 19741224; JA50-456 19741224
- 主分类号: G01R29/22
- IPC分类号: G01R29/22 ; G01R23/00
摘要:
The present invention discloses a method of constructing a non-reactive high frequency constant resistance unit to be used for measuring parameters of quartz crystal units described in U.S. Pat. No. 3,832,631 and U.S. Pat. No. 3,872,385. First, a non-reactive frequency of a crystal unit A is determined, a radio-frequency current is supplied to the series circuit A+ B composed of said crystal unit A and a circuit B which is adjustable to non-reactiveness, and the circuit B is adjusted so that the phase of the terminal voltage across said series circuit A+B coincides with the phase of the terminal voltage across the circuit B. Next, said crystal unit A is replaced by an element A, whose construction is similar to the said circuit B, and is adjustable to non-reactiveness, and the element A is adjusted so that the phase of the terminal voltage across said series circuit A+B coincides with the phase of the terminal voltage across the circuit B. Lastly, the construction of A is fixed, whereby said element A is always available as a substitute for A, for checking the non-reactiveness of the circuit B.
公开/授权文献
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