发明授权
- 专利标题： Light measuring circuit with stray capacitance compensating means
- 专利标题（中）： 具有杂散电容补偿装置的光测量电路
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申请号： US644317申请日： 1975-12-24
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公开(公告)号： US4076977A公开(公告)日： 1978-02-28
- 发明人: Tokuichi Tsunekawa , Tetsuya Taguchi
- 申请人： Tokuichi Tsunekawa , Tetsuya Taguchi
- 申请人地址： JA Tokyo
- 专利权人： Canon Kabushiki Kaisha
- 当前专利权人： Canon Kabushiki Kaisha
- 当前专利权人地址： JA Tokyo
- 优先权： JA49-2479 19741228; JA50-82116 19750702
- 主分类号： G01J1/44
- IPC分类号： G01J1/44 ; G03B7/081 ; H01J39/12 ; G01J1/32
摘要：
The present invention relates to a light measuring circuit consisting of an operational amplifier, a feed back path connected with said operational amplifier, a photo voltaic cell and a switching circuit for bringing the input terminals of said operational amplifier to the same potential at the time light measurement is commenced. By means of this switching circuit connected to the light measuring circuit the delayed response of the light measuring circuit due to the stray capacitence existing between the input terminal of the operational amplifier and ground is remarkably improved.
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