发明授权
- 专利标题: Method of and apparatus for electrical short testing and the like
- 专利标题(中): 电气短路测试的方法和装置等
-
申请号: US50993申请日: 1979-06-22
-
公开(公告)号: US4290013A公开(公告)日: 1981-09-15
- 发明人: David W. Thiel
- 申请人: David W. Thiel
- 申请人地址: MA Concord
- 专利权人: GenRad, Inc.
- 当前专利权人: GenRad, Inc.
- 当前专利权人地址: MA Concord
- 主分类号: G01R31/02
- IPC分类号: G01R31/02 ; G01R15/12
摘要:
This disclosure is concerned with a process for connecting a short detector to electrical nodes in such apparatus as backplanes, cables and circuit boards before components are assembled thereto, to identify shorted node pairs in a substantially smaller number of tests than required by previously known methods, through a novel binary screening and then binary searching technique; the invention being especially efficient in the case where no shorts are present.
公开/授权文献
- US06035318A Booth multiplier for handling variable width operands 公开/授权日:2000-03-07
信息查询