发明授权
US4290013A Method of and apparatus for electrical short testing and the like 失效
电气短路测试的方法和装置等

  • 专利标题: Method of and apparatus for electrical short testing and the like
  • 专利标题(中): 电气短路测试的方法和装置等
  • 申请号: US50993
    申请日: 1979-06-22
  • 公开(公告)号: US4290013A
    公开(公告)日: 1981-09-15
  • 发明人: David W. Thiel
  • 申请人: David W. Thiel
  • 申请人地址: MA Concord
  • 专利权人: GenRad, Inc.
  • 当前专利权人: GenRad, Inc.
  • 当前专利权人地址: MA Concord
  • 主分类号: G01R31/02
  • IPC分类号: G01R31/02 G01R15/12
Method of and apparatus for electrical short testing and the like
摘要:
This disclosure is concerned with a process for connecting a short detector to electrical nodes in such apparatus as backplanes, cables and circuit boards before components are assembled thereto, to identify shorted node pairs in a substantially smaller number of tests than required by previously known methods, through a novel binary screening and then binary searching technique; the invention being especially efficient in the case where no shorts are present.
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