发明授权
- 专利标题: Semi-automatic scanner for ultrasonic flaw detection
- 专利标题(中): 半自动扫描仪用于超声波探伤
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申请号: US184376申请日: 1980-09-05
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公开(公告)号: US4383448A公开(公告)日: 1983-05-17
- 发明人: Hirotsugu Fujimoto , Tsutomu Hayashi , Tatsukuma Hosono
- 申请人: Hirotsugu Fujimoto , Tsutomu Hayashi , Tatsukuma Hosono
- 申请人地址: JPX Tokyo JPX Tokyo
- 专利权人: Hitachi, Ltd.,Hitachi Engineering Co., Ltd.
- 当前专利权人: Hitachi, Ltd.,Hitachi Engineering Co., Ltd.
- 当前专利权人地址: JPX Tokyo JPX Tokyo
- 优先权: JPX54-114252 19790907
- 主分类号: G01N29/04
- IPC分类号: G01N29/04 ; G01N29/265
摘要:
A semi-automatic scanner for ultrasonic flaw detection comprises a carriage travelling on a guide rail, a guide arm extending in a direction transverse to the travel direction of the carriage and supported by the carriage so as to pivot in a plane transverse to the travel direction of the carriage, a probe holder slidably supported by the arm, and a probe mounted on said probe holder so as to pivot about two axes transverse to each other. One of the axes is generally in parallel to the travel direction of the carriage. The carriage is driven by a motor, and the probe is moved by manual or motor-driving operation in a direction transverse to the travel direction of the carriage while pressing the probe on a surface to be inspected, whereby the probe accurately follows the surface even if the surface is curved.