发明授权
- 专利标题: Charged particle beam scanning device
- 专利标题(中): 带电粒子束扫描装置
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申请号: US312955申请日: 1981-10-20
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公开(公告)号: US4439681A公开(公告)日: 1984-03-27
- 发明人: Setsuo Norioka , Naoki Date
- 申请人: Setsuo Norioka , Naoki Date
- 申请人地址: JPX Tokyo
- 专利权人: Jeol Ltd.
- 当前专利权人: Jeol Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX55-149165 19801024
- 主分类号: H01J37/22
- IPC分类号: H01J37/22 ; H01J37/24 ; H01J37/28 ; H04N3/22 ; H01J37/26
摘要:
A charged particle beam scanning device is provided with two coordinates conversion circuits. For rotating the scanning direction of the charged particle beam, one of the coordinates conversion circuit is connected between a scanning signal generator and a magnification circuit, the output of which is supplied to a deflecting means for scanning the charged particle beam over the specimen surface, as in the case of a conventional device. Another coordinates conversion circuit is used for keeping independent operation of the image rotation and the image shift. This coordinates conversion circuit converts the output signal of a d.c. signal generator for image shift, and the converted signal is added to the input signal of the said magnification circuit.
公开/授权文献
- US4870990A Double-flow butterfly valve part 公开/授权日:1989-10-03
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