发明授权
- 专利标题: Gas flow rate measuring apparatus
- 专利标题(中): 气体流量测量装置
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申请号: US312983申请日: 1981-10-20
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公开(公告)号: US4471655A公开(公告)日: 1984-09-18
- 发明人: Hideki Obayashi , Tokio Kohama , Hisasi Kawai , Tsuneyuki Egami
- 申请人: Hideki Obayashi , Tokio Kohama , Hisasi Kawai , Tsuneyuki Egami
- 申请人地址: JPX Nishio
- 专利权人: Nippon Soken, Inc.
- 当前专利权人: Nippon Soken, Inc.
- 当前专利权人地址: JPX Nishio
- 优先权: JPX55-149815 19801024; JPX55-149816 19801024; JPX55-149817 19801024
- 主分类号: G01F1/68
- IPC分类号: G01F1/68 ; G01F1/684 ; G01F1/69
摘要:
An apparatus for measuring the flow rate of a gas wherein resistance wires whose resistance value changes in accordance with temperature are arranged in a flow rate measuring tube providing a path of a gas to be measured, a voltage is applied to the resistance wires to detect the change in resistance value of the resistance wires due to the change in temperature thereof in accordance with the gas flow rate, and the flow rate of the gas is measured. In order to support the resistance wires in the flow rate measuring tube, the support members for supporting the resistance wires have respectively two support rods provided with grooves at positions corresponding to the turning points of the resistance wires wound thereon so that the resistance wires are supported stably lying in the grooves.
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