Invention Grant
- Patent Title: Error correction system for measuring instrument
- Patent Title (中): 测量仪器误差校正系统
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Application No.: US583692Application Date: 1984-02-27
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Publication No.: US4608758APublication Date: 1986-09-02
- Inventor: Karl-Hermann Voelk , Karl-Heinz Wehrstein
- Applicant: Karl-Hermann Voelk , Karl-Heinz Wehrstein
- Applicant Address: DEX Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DEX Traunreut
- Priority: DEX3311562 19830330
- Main IPC: G01B21/02
- IPC: G01B21/02 ; G01B5/00 ; G01D5/347 ; G01B11/04
Abstract:
A measuring system includes a measuring graduation and scanning unit which scans the measuring graduation. The scanning unit and the measuring graduation are connected to respective ones of two objects, the position of which is to be measured. An error correction system which includes an error correction profile is provided for the correction of errors such as graduation errors and/or machine errors. The position of the correction profile is adjustable transversely to the measuring direction by means of eccentrics. Each of the eccentrics defines an index mark which is used with an error correction scale to indicate the position of the eccentric and therefore the deflection of the correction profile. In order to facilitate reproduceable error correction, the index marks are each defined by a respective index mark carrier which is mounted to the eccentric in an adjustable manner such that the index marks can be repositioned to define any arbitrary orientation of the eccentrics as a new zero position.
Public/Granted literature
- US5611915A Process for removal of heteroatoms under reducing conditions in supercritical water Public/Granted day:1997-03-18
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