发明授权
- 专利标题: Method for making bipolar transistors using rapid thermal annealing
- 专利标题(中): 使用快速热退火制造双极晶体管的方法
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申请号: US904547申请日: 1986-09-08
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公开(公告)号: US4755487A公开(公告)日: 1988-07-05
- 发明人: Peter D. Scovell , Roger L. Baker , David W. McNeil
- 申请人: Peter D. Scovell , Roger L. Baker , David W. McNeil
- 申请人地址: GB2 London
- 专利权人: STC PLC
- 当前专利权人: STC PLC
- 当前专利权人地址: GB2 London
- 优先权: GBX8523369 19850921
- 主分类号: H01L29/73
- IPC分类号: H01L29/73 ; H01L21/225 ; H01L21/331 ; H01L21/324
摘要:
In making bipolar transistors, an interfacial oxide layer (5) is formed over ther monocrystalline region (1), and polysilicon (6) is formed both thereon as an extrinsic emitter region. After doping the polysilicon a monocrystalline emitter region (4) is produced in the base region by diffusion from the extrinsic polysilicon emitter region. The oxide layer (5) acts as a diffusion barrier to ensure that excessive dopant does not reach the monocrystalline region.After the above operation, a thermal treatment is effected at a higher temperature, e.g. 1100.degree. C., for a few seconds, which breaks down the interfacial oxide layer referred to above. This temporary use of the interfacial oxide layer leads to better and more consistant transistor characteristics.
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