发明授权
US4755743A Method and apparatus for measuring the moisture content or dry-matter content of materials using a microwave dielectric waveguide 失效
使用微波介质波导测量材料的含水量或干物质含量的方法和装置

  • 专利标题: Method and apparatus for measuring the moisture content or dry-matter content of materials using a microwave dielectric waveguide
  • 专利标题(中): 使用微波介质波导测量材料的含水量或干物质含量的方法和装置
  • 申请号: US787271
    申请日: 1985-10-14
  • 公开(公告)号: US4755743A
    公开(公告)日: 1988-07-05
  • 发明人: Pekka Jakkula
  • 申请人: Pekka Jakkula
  • 申请人地址: FIX Helsinki
  • 专利权人: Kemira Oy
  • 当前专利权人: Kemira Oy
  • 当前专利权人地址: FIX Helsinki
  • 优先权: FIX844061 19841016
  • 主分类号: G01N22/04
  • IPC分类号: G01N22/04
Method and apparatus for measuring the moisture content or dry-matter
content of materials using a microwave dielectric waveguide
摘要:
A method and apparatus for measuring the moisture content or dry content of either high or low loss materials having a moisture content in excess of 50% utilizing a dielectric waveguide in contact with the material to be measured. The waveguide may be either embedded into the wall of a process pipe or it may pass through the pipe. The length of the waveguide can be controlled by the addition of reflecting spikes. The waveguide is designed and the microwave frequency so chosen that the microwave signal is reflected at least ten times. The strength of the output microwave signal is a function of the moisture content.
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