发明授权
- 专利标题： Thermal shock test apparatus and the method of testing
- 专利标题（中）： 热冲击试验装置及其测试方法
-
申请号： US122166申请日： 1987-11-18
-
公开(公告)号： US4793716A公开(公告)日： 1988-12-27
- 发明人: George C. Wei , John Walsh
- 申请人： George C. Wei , John Walsh
- 申请人地址： MA Waltham
- 专利权人： GTE Laboratories Incorporated
- 当前专利权人： GTE Laboratories Incorporated
- 当前专利权人地址： MA Waltham
- 主分类号： G01N3/60
- IPC分类号： G01N3/60 ; G01N17/00 ; G01N25/00 ; G01N33/38 ; G01N25/72
摘要：
A thermal shock apparatus comprises a hot gas stream impinging means, a hot gas stream impinging control means, a positioning means for the hot gas stream impinging means, and a sample holding means. A sample is subjected to an essentially instantaneous impingement of a hot gas stream upon a predetermined area of the sample when a heat gun is moved past heat deflection foils and positioned above the sample causing a thermal shock within the sample.