发明授权
US4882539A Monitoring system for electrodynamic wall-thickness and defect testing
using a delay line
失效
使用延迟线进行电动壁厚检测和缺陷检测的监控系统
- 专利标题： Monitoring system for electrodynamic wall-thickness and defect testing using a delay line
- 专利标题（中）： 使用延迟线进行电动壁厚检测和缺陷检测的监控系统
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申请号： US164575申请日： 1988-03-07
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公开(公告)号： US4882539A公开(公告)日： 1989-11-21
- 发明人: Joerg Quittkat , Gerhard Thiel
- 申请人： Joerg Quittkat , Gerhard Thiel
- 申请人地址： DEX Munich
- 专利权人： Siemens Aktiengesellschaft
- 当前专利权人： Siemens Aktiengesellschaft
- 当前专利权人地址： DEX Munich
- 优先权： DEX3707048 19870305
- 主分类号： G01B7/06
- IPC分类号： G01B7/06 ; G01B17/00 ; G01B21/08
摘要：
A monitoring system monitoring electrical components of an apparatus for electrodynamic wall-thickness and defect testing includes a transmitter generating brief signals. An electrodynamic converter has a transmitter coil connected to the transmitter for receiving the brief signals and feeding the brief signals into a workpiece to be tested in which the brief signals are reflected. The electrodynamic converter has a receiver coil receiving the reflected signals. An amplifier is connected to the receiver coil for receiving the reflected signals and an evaluation unit is connected to the amplifier for receiving the reflected signals. At least one damping element and a delay line are connected to the transmitter for delaying and damping the brief signals. The delay line is coupled through the electrodynamic converter to the evaluation unit for feeding the delayed and damped signals to the transmitter coil.
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