发明授权
US4885748A Method and circuit configuration of the parallel input of data into a semiconductor memory 失效
将数据并行输入到半导体存储器中的方法和电路配置

Method and circuit configuration of the parallel input of data into a
semiconductor memory
摘要:
A method and circuit configuration for the parallel input of data items in the form of a test pattern into a block of a semiconductor memory having a plurality of storage cells. For test purposes, data items are simultaneously input in parallel into the storage cells.
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