发明授权
US4889493A Method of manufacturing the substrate of GaAs compound semiconductor
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制造GaAs化合物半导体衬底的方法
- 专利标题: Method of manufacturing the substrate of GaAs compound semiconductor
- 专利标题(中): 制造GaAs化合物半导体衬底的方法
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申请号: US229993申请日: 1988-08-09
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公开(公告)号: US4889493A公开(公告)日: 1989-12-26
- 发明人: Yasuo Otsuki , Yoshio Nakamura
- 申请人: Yasuo Otsuki , Yoshio Nakamura
- 申请人地址: JPX Tokyo
- 专利权人: The Furukawa Electric Co., Ltd.
- 当前专利权人: The Furukawa Electric Co., Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX62-202223 19870813
- 主分类号: C30B29/42
- IPC分类号: C30B29/42 ; C30B33/00 ; C30B33/02 ; H01L21/304 ; H01L21/324
摘要:
A method of manufacturing a substrate of a GaAs compound semiconductor is disclosed, which is characterized in that, after a crystal of GaAs compound semiconductor obtained by the liquid encapsulated Czocharalski method is annealed in the form of ingot, gradually cooled to room temperature and cut off in the form of a wafer, a re-heating treatment consisting of heating to a temperature of not lower than 700.degree. C., rapid cooling from the temperature of not lower than 700.degree. C. to a temperature of not higher than 400.degree. C. within 30 minutes and successive cooling to room temperature is given to the wafer, and then mirror polishing is performed.
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