A static random access memory cell implemented with metal Schottky field-effect transistors. The cell has first and second branches, each of the branches including: a depletion mode current limiting transistor having a drain connected to a first circuit node; a depletion mode load transistor having a drain connected to the source of the current limiting transistor and a source connected to a second circuit node; an enhancement mode active transistor having a drain connected to the second circuit node and a source connected to a third circuit node; an enhancement mode access transistor having a source connected to the second circuit node and a gate connected to the gate of the current limiting transistor; the gate of the load transistor connected to the second circuit node; the commonly connected gates of the current limiting transistor and the access transistor adapted to receive a word-line signal; and the drain of the access transistor adapted to receive a bit-line signal. The first circuit node is adapted for connection to a source of bias voltage, and the third circuit node is adapted for connection to a circuit ground. The first and second branches are cross-connected between the second nodes and the gates of the active transistors.