发明授权
- 专利标题: Method of tracing contour and a system therefor
- 专利标题(中): 跟踪轮廓的方法及其系统
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申请号: US154378申请日: 1988-02-10
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公开(公告)号: US4956869A公开(公告)日: 1990-09-11
- 发明人: Takafumi Miyatake , Hitoshi Matsushima
- 申请人: Takafumi Miyatake , Hitoshi Matsushima
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 主分类号: G06T7/60
- IPC分类号: G06T7/60 ; G06K9/48 ; G06T5/00 ; G06T9/20
摘要:
A system for tracing contour to prepare contour coordinates by tracing contour lines of a figure from an image that consists of a set of a plurality of lines, comprising a memory stored in advance from a basic pattern related to figure contour lines of positions of image transistion points between the neighboring two lines. An image transition point of a line is detected and another image transition point of a line that precedes the above line is detected, too. A pattern of image transistion points of the above two lines is extracted based upon the basic pattern. The thus extracted basic patterns are then integrated and are converted into contour coordinates.
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