发明授权
- 专利标题: Plasma source mass spectrometer
- 专利标题(中): 等离子体质谱仪
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申请号: US432895申请日: 1989-11-07
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公开(公告)号: US4963735A公开(公告)日: 1990-10-16
- 发明人: Yukio Okamoto , Tsutomu Komoda , Satoshi Shimura , Seiichi Murayama , Masataka Koga
- 申请人: Yukio Okamoto , Tsutomu Komoda , Satoshi Shimura , Seiichi Murayama , Masataka Koga
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX63-283602 19881111; JPX01-023835 19890203
- 主分类号: H01J49/10
- IPC分类号: H01J49/10
摘要:
A plasma source mass spectrometer in which ions in a plasma generated in a high pressure (.ltoreq.1 atm) region are introduced into a low pressure (.ltoreq.10.sup.-5 Torr) region to analysis the ion mass includes a moderate pressure (.gtoreq.10.sup.-3 Torr) region which is provided between the high pressure region and the low pressure region. The plasma generated in the high pressure region is diffused to the moderate pressure region in order to produce a diffused plasma. Ions are extracted from the diffused plasma by an ion extraction electrode having an ion extraction opening. In the vicinity of the ion extraction opening a convex-shaped toward the diffused plasma whereby ion sheath is formed, whereby the ions can be extracted toward the low pressure region with a high efficiency.
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