发明授权
- 专利标题: Capacitive void fraction measurement apparatus
- 专利标题(中): 电容性空隙率测量装置
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申请号: US408451申请日: 1989-09-15
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公开(公告)号: US5017879A公开(公告)日: 1991-05-21
- 发明人: Gary Lucas , Maurice Beck , Andrew Hunt
- 申请人: Gary Lucas , Maurice Beck , Andrew Hunt
- 申请人地址: TX Houston
- 专利权人: Schlumberger Technology Corporation
- 当前专利权人: Schlumberger Technology Corporation
- 当前专利权人地址: TX Houston
- 优先权: GBX8721858 19870917
- 主分类号: G01N27/22
- IPC分类号: G01N27/22
摘要:
An apparatus for use in the capacitive measurement of the void fraction in a flowing liquid. An assembly of at least two electrodes is spaced apart around the exterior of the body defining a flow passage such that the capacitance of the electrode assembly is a function of the dielectric constant of material within the passageway. The radial thickness of the body is substantial such that the passageway occupies a portion of the electrostatic field of the electrode assembly which is relatively uniform. The dielectric constant of the body may be substantially equal to the expected dielectric constant of the said liquid. The body may be tubular with the electrode assembly directly supported on the radially outer surface of the tube.
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