A system (100) performs concurrent testing and lead verification of an electronic component (104) having two leads (126 and 128). The system includes circuitry (114 and 116) for determining a sum of amounts of contact resistances between first (132) and second (134) probes and one of the leads by producing a current (I.sub.1) that propagates through the first probe, the lead of the component, and the second probe. The sum of the contact resistances is proportional to the difference in voltage between the leads. If the difference exceeds a limit, then the sum of the amount of contact resistances is excessive. The system also includes circuitry (110) for determining a value of a parameter of the component while the sum of the amounts of contact resistances is being determined. The circuit for determining the sum of the contract resistances and the circuitry for determining the value of the parameter are electrically isolated from each other so that they do not influence each other.