An arrangement for measuring the quiescent current of a digital IC includes a current sensor connected in series with the IC and the voltage supply, a voltage stabilization circuit for stabilizing the voltage across the IC and a signal processing circuit coupled thereto for processing the measured quiescent current. The quiescent current is measured when no flip-flops are switched in the IC. By means of the arrangement, it is possible to measure rapidly and accurately whether the quiescent current assumes an abnormal value, which indicates that the IC contains defects. The signal processing circuit may include a current mirror which is coupled to a current comparator circuit supplying a digital output signal for determining the existence of a defect.