发明授权
US5062144A Method of obtaining white reference data used for correcting non-uniformity in photoelectric cell array 失效
获得用于校正光电池阵列中非均匀性的白色参考数据的方法

  • 专利标题: Method of obtaining white reference data used for correcting non-uniformity in photoelectric cell array
  • 专利标题(中): 获得用于校正光电池阵列中非均匀性的白色参考数据的方法
  • 申请号: US334086
    申请日: 1989-04-06
  • 公开(公告)号: US5062144A
    公开(公告)日: 1991-10-29
  • 发明人: Shigeo Murakami
  • 申请人: Shigeo Murakami
  • 申请人地址: JPX
  • 专利权人: Dainippon Screen 303 1o. Ltd.
  • 当前专利权人: Dainippon Screen 303 1o. Ltd.
  • 当前专利权人地址: JPX
  • 优先权: JPX63-85667 19880406
  • 主分类号: G06T1/00
  • IPC分类号: G06T1/00 H04N1/401
Method of obtaining white reference data used for correcting
non-uniformity in photoelectric cell array
摘要:
In an image scan reader, a white reference plate is attached to a transparent plate on which an original is to be placed. Different regions are defined on the reference plate and respective optical densities on a plurality of scanning lines (L.sub.Al -L.sub.An, L.sub.Bl -L.sub.Bm) are detected and averaged within each region (R.sub.A, R.sub.B). The maximum averaged densities are selected for each given pixel position to be used for correcting the non-uniformity of CCD cells which are employed in reading the white reference plate and the image of the original.
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