The invention is directed to an optoelectronic probing device for a coordinate measuring apparatus. The probe is exchangeable automatically via a probe changing device. The probing device has a temperature sensor which is in thermal contact with the material of the probing device. The connecting terminals of the sensor are applied to contacts on the exchange face of the probing device. In this way, it is possible to immediately determine the position of the optoelectronic components of the probe from the calibration data obtained at other temperatures after each probe exchange.