发明授权
- 专利标题： X ray detecting device
- 专利标题（中）： X射线检测装置
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申请号： US299103申请日： 1989-01-19
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公开(公告)号： US5066861A公开(公告)日： 1991-11-19
- 发明人: Takehisa Nakayama , Akimine Hayashi , Masataka Kondo , Satoru Murakami , Minori Yamaguchi , Yoshihisa Tawada , Masahiko Hosomi
- 申请人： Takehisa Nakayama , Akimine Hayashi , Masataka Kondo , Satoru Murakami , Minori Yamaguchi , Yoshihisa Tawada , Masahiko Hosomi
- 申请人地址： JPX Osaka
- 专利权人： Kanegafuchi Chemical Industry Co., Ltd.
- 当前专利权人： Kanegafuchi Chemical Industry Co., Ltd.
- 当前专利权人地址： JPX Osaka
- 优先权： JPX62-184056 19870722; JPX62-198377 19870807; JPX62-198378 19870807; JPX62-272640 19871028; JPX62-272641 19871028; JPX62-272642 19871028
- 主分类号： G01T1/20
- IPC分类号： G01T1/20 ; G01T1/24
摘要：
In an X ray detecting device comprising XL converting unit for converting the X rays into visible light corresponding to the intensity of the X rays and a LE converting unit for converting the visible light into an electrical signal corresponding to the intensity of the visible light, the base layer of the LE converting unit is formed of a material such that the base layer does not substantially absorb the X rays so that the image of the LE converting unit does not appear on the picture of the object.
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