发明授权
- 专利标题: Light waveform measuring apparatus
- 专利标题(中): 光波形测量装置
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申请号: US416774申请日: 1989-10-04
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公开(公告)号: US5071249A公开(公告)日: 1991-12-10
- 发明人: Akira Takahashi , Musubu Koishi , Yutaka Tsuchiya
- 申请人: Akira Takahashi , Musubu Koishi , Yutaka Tsuchiya
- 申请人地址: JPX Shizuoka
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JPX Shizuoka
- 优先权: JPX63-251517 19881005; JPX1-55531 19890308
- 主分类号: G01J1/44
- IPC分类号: G01J1/44 ; G01J11/00 ; G01N21/64
摘要:
A wavelength of light emitted from a semiconductor laser is shifted to a shorter wavelength with wavelength converting means and the resulting light of a shorter wavelength is applied to a sample. Upon exposure to the light of the shorter wavelength, the sample emits light of interest and its waveform is measured with measuring means. Fundamental wavelength laser light which passes through the waveform converting means is outputted therefrom in synchronism with the light of a shorter wavelength and detected by a first photodetector. The waveform of the light of interest can be measured correctly on the basis of an output signal from the first photodetector.
公开/授权文献
- US5521784A Cover layer in filter unit for connectors 公开/授权日:1996-05-28
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