发明授权
- 专利标题： Strain measuring device employing magnetostriction and having a magnetic shielding layer
- 专利标题（中）： 使用磁场并具有磁性屏蔽层的应变测量装置
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申请号： US686380申请日： 1991-04-17
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公开(公告)号： US5105667A公开(公告)日： 1992-04-21
- 发明人: Hiroshi Satoh , Yoshihiko Utsui
- 申请人： Hiroshi Satoh , Yoshihiko Utsui
- 申请人地址： JPX Tokyo
- 专利权人： Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人： Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址： JPX Tokyo
- 优先权： JPX63-147281 19880615; JPX63-162807 19880629
- 主分类号： G01L1/12
- IPC分类号： G01L1/12 ; G01L3/10
摘要：
In a strain measuring device employing a magnetic permeability detector means to detect an amount of strain in a passive member as changes of magnetic permeability in a magnetostrictive layer, a magnetic shielding layer is formed on the surface of the passive member, and the magnetostrictive layer is formed thereon so as to lessen the adverse effects of the passive member caused by the magnetic characteristics of the passive member in strain measurement, that is, to reduce measurement errors. Alternatively, a magnetostrictive layer is formed on the surface of the passive member, or a magnetic shielding layer is partially formed on the surface of the passive member of a soft magnetic material with high permeability, so as to lessen the influence of the passive member caused by thermal stresses of the passive member in strain measurement, that is, to reduce measurement errors. Further, there is provided a strain measuring device which facilitates formation of the magnetostrictive layer.
公开/授权文献
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