发明授权
- 专利标题: Eddy current flaw detecting endoscope apparatus which produces signals which control other devices
- 专利标题(中): 产生控制其他装置的信号的涡流探伤内窥镜装置
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申请号: US558534申请日: 1990-07-27
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公开(公告)号: US5140265A公开(公告)日: 1992-08-18
- 发明人: Katsunori Sakiyama , Yoshikazu Tojo , Yasundo Tanaka , Morihide Mizumoto , Minoru Okada , Masanao Murata , Atsushi Miyazaki , Takeaki Nakamura , Hiromasa Suzuki
- 申请人: Katsunori Sakiyama , Yoshikazu Tojo , Yasundo Tanaka , Morihide Mizumoto , Minoru Okada , Masanao Murata , Atsushi Miyazaki , Takeaki Nakamura , Hiromasa Suzuki
- 申请人地址: JPX Tokyo
- 专利权人: Olympus Optical Co., Ltd
- 当前专利权人: Olympus Optical Co., Ltd
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX1-332262 19891220; JPX1-332263 19891220; JPX2-27843 19900202; JPX2-35242 19900215
- 主分类号: G01N27/90
- IPC分类号: G01N27/90
摘要:
An eddy current flaw detecting endoscope apparatus has an endoscope having an elongate insertable part and an objective optical system provided on the tip side of the insertable part. A flaw detecting device is provided on the tip side of the endoscope. A signal processing device processes a signal for the flaw detecting device. An eddy current flaw detecting apparatus detects a flaw in an object to be inspected and generates a flaw detecting signal. A controlling device generates a control signal controlling a controlled device with a flaw detecting signal of the eddy current flaw detecting apparatus.
公开/授权文献
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