Invention Grant
US5142222A Integrated circuit device having signal discrimination circuit and
method of testing same
失效
具有信号鉴别电路的集成电路装置及其测试方法
- Patent Title: Integrated circuit device having signal discrimination circuit and method of testing same
- Patent Title (中): 具有信号鉴别电路的集成电路装置及其测试方法
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Application No.: US789814Application Date: 1991-11-12
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Publication No.: US5142222APublication Date: 1992-08-25
- Inventor: Masahiro Tanaka , Kazuhiro Tomita , Kazumi Ogawa
- Applicant: Masahiro Tanaka , Kazuhiro Tomita , Kazumi Ogawa
- Applicant Address: JPX Kawasaki JPX Kasugai
- Assignee: Fujitsu Limited,Fujitsu VLSI Limited
- Current Assignee: Fujitsu Limited,Fujitsu VLSI Limited
- Current Assignee Address: JPX Kawasaki JPX Kasugai
- Priority: JPX63-275280 19881031; JPX63-325412 19881223; JPX1-004400 19890111
- Main IPC: G01R31/317
- IPC: G01R31/317
Abstract:
An integrated circuit device formed on a chip includes a pair of signal input terminals, a signal discriminating circuit having a pair of input terminals coupled to the signal input terminals, for comparing a data signal and a reference signal supplied through the input terminals and for determining whether or not the level of said data signal is higher than that of said reference signal, a pair of test signal terminals to which a predetermined voltage is applied, and a voltage dividing circuit for dividing the predetermined voltage to thereby generate a test signal to be supplied to the signal discriminating circuit through the input terminals.
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