发明授权
- 专利标题: X-ray examination apparatus
- 专利标题(中): X射线检查装置
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申请号: US821824申请日: 1992-01-17
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公开(公告)号: US5146485A公开(公告)日: 1992-09-08
- 发明人: Gerd Schweichler , Michael Meyer
- 申请人: Gerd Schweichler , Michael Meyer
- 申请人地址: Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: Munich
- 优先权: DEX4102894 19910131
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
An x-ray examination apparatus which enables free access to the patient in interventional radiology given a simple structural format has an x-ray radiator and an x-ray image intensifier at least one of which is adjustable on a spherical surface. To this end, at least one of these components, such as the x-ray image intensifier is suspended by a telescopically extendable circular arc section so as to be adjustable in a circumferential direction. The arc section is adjustable in ceiling rails extending perpendicular to the surface defined by the arc section. The suspended component is held in a holder so as to be pivotable around a transverse axis and the holder is longitudinally displaceable.
公开/授权文献
- US4644509A Ultrasonic audience measurement system and method 公开/授权日:1987-02-17
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